Chanana RK. Metal-Insulator-Semiconductor Characterization by Fowler-Nordheim Carrier Tunnelling Currents Through MOS Devices. TECS [Internet]. 2023 Sep. 10 [cited 2026 May 6];11(5):45-50. Available from: https://scholarpublishing.org/journals/index.php/TECS/article/view/2283