HARINATH, Depavath; BABU, K. Ramesh; SATYANARAYANA, P.; MURTHY, M.V. Ramana. Defect Detection in Fabric using Wavelet Transform and Genetic Algorithm. Transactions on Engineering and Computing Sciences, [S. l.], v. 3, n. 6, p. 10, 2016. DOI: 10.14738/tmlai.36.1551. Disponível em: https://scholarpublishing.org/journals/index.php/TECS/article/view/2366. Acesso em: 6 may. 2026.