CHANANA, Ravi Kumar. Electrical Properties of Sub-1nm Diameter Silicon Nanowire Metal-Oxide-Semiconductor Device. European Journal of Applied Sciences, [S. l.], v. 13, n. 05, p. 128–130, 2025. DOI: 10.14738/aivp.1305.19403. Disponível em: https://scholarpublishing.org/journals/index.php/EJAS/article/view/10786. Acesso em: 30 may. 2026.